ISO-9001

FS34680

A Responsible Care*
Company 

X-Ray Diffraction is useful for the identification of crystalline compounds. This non-destructive technique provides semi-quantitative data on mixtures. A computer-based search and match routine permits positive identification of unknowns. Diffraction patterns of samples can be obtained from approximately 0.5° - 150° (two-theta). Certain crystalline phases can be quantified. Powder samples of 1 mg or greater can be analyzed.

• Low-angle analysis of crystalline coatings and films.
• Identification of fillers, clays, and refractory components in coating formulations.
• Compositional analysis of crystalline solid compounds.
• Small spot analysis of features ≥ .250 mm
• High temperature studies up to 1200°C
• Transmission analysis of polymeric thin films