ISO-9001

FS34680

A Responsible Care*
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Scanning Electron Microscopy (SEM) offers high magnification and resolution for examination of sample surfaces. Magnifications commonly range from 10x to 100,000x. The Secondary Electron Imaging (SEI) signal provides "near surface" interpretation of sample morphology; the Backscattered Electron Imaging (BEI) signal provides information regarding variability in sample composition, density, and surface geometry. Environmental Scanning Electron Microscopy (ESEM) allows imaging of uncoated, wet or non-conductive samples in humidified or gaseous environments at pressures up to 50 Torr. This, plus heated and cooled stages, expand the realm of SEM analyses to better simulate real-world conditions. Conventional high vacuum imaging also is available. All systems are interfaced with image analysis software for determination of particle dimensions, particle count, etc.

• Analysis of variations in surface morphology as related to adhesion performance.
• Examination of particulates and fibers.
• Thickness measurements of coatings and films.
• Failure analysis of metal casting defects.
• General high-magnification studies.
• Determination of particle dimensions, particle count, etc., using image analysis software.