ISO-9001

FS34680

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Wavelength Dispersive XRF can qualitatively and quantitatively determine the presence of elements from carbon through uranium in the periodic table. Both solids and liquids can readily be assayed for composition or contamination, and quantitative analyses can be performed either via a calibration curve or a standardless fundamental parameters technique. The instrument is equipped with a 24-position autosampler, enabling greater sample throughput, and a 4kW X-ray tube that, along with state-of-the-art crystals and detectors, yield detection limits of 1 part per million for many analytes.

• Quantitative analysis of trace metals used as catalysts, cross-linking agents, etc.
• Determination of fire-retardant additives.
• Identification of low-level contaminants.
• Bulk compositional analysis.

EDS is capable of surveying samples for elements from boron through uranium. Element mapping can be done across sample surfaces. Computer-based analysis allows for the storage and retrieval of X-ray spectra, comparison to standards for quantitative analysis and standardless analysis. The line profile mode compares element concentration versus depth. Digital mapping can be conducted for up to 16 elements simultaneously across a sample surface. Sensitivity of this technique is approximately 0.1% (1000 ppm) for all elements.

• Analysis of contaminants or corrosion products in casting defects.
• Identification of trace metals used as catalytic, cross-linking, or fire-retardant agents in various resin systems.
• Qualitative analysis of powders such as fillers and core-coating formulations.